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采用MOCVD工艺在Ts=440℃条件下制备组分Bi/Ti=1.44的非晶态薄膜,经过快速退火处理,制备高度择优取向的Bi4Ti3O12 铁电薄膜,在Ts=400℃条件下制备组分Bi/Ti=1.11的非晶态薄膜,经过快速退火处理,制备高度择优取向的Bi2Ti2O7薄膜,较好的退火温度为630℃、时间为60s;快速退火对薄膜组分的影响不大,在相同的退火温度下,生成43相还是22相取决于退火前薄膜材料的组分.

参考文献

[1] Scott L Swartz;Thomas R Shrout;Tadashi Takenaka .Electronic ceramics R·D in the U S ,Japan part I: Pantent history[J].American Ceramic Society Bulletin,1997,76(07):59-65.
[2] Lampe D R;Adams D A;Austin M .[J].FERROELECTRICS,1992,133:61-72.
[3] Swartz S L;Wood V E .Ferroelectric thin films[J].Condensed Matter News,1992,1(05):4-13.
[4] Wang H;Fu L W;Shang S X .Preparation and properties of Bi4Ti3O12 single-crystal thin films by atmospheric pressure metalorganic chemical vapor deposition[J].Journal of Applied Physics,1993,73(11)
[5] Scott L Swartz;Thomas R Shrout;Tadashi Takenaka .Electronic ceramics R·D in the U S,Japan part Ⅱ: Japan view[J].American Ceramic Society Bulletin,1997,76(08):51-55.
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