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采用射频磁控反应溅射法,以高纯Si为靶材,高纯O2和N2气为反应气体,在蓝宝石衬底上制备了氧化硅和氮化硅薄膜.讨论了N2气流量、射频功率、溅射气压和靶基距等工艺参数对Si3N4薄膜沉积速率的影响规律.结果表明:随N2气流量的增加,沉积速率先降低,最后趋于稳定;随射频功率增加,沉积速率增加;随溅射气压和靶基距增加,沉积速率先增后减.同时,高温强度试验和FTIR测试结果表明:在800℃时,镀膜后蓝宝石的弯曲强度比镀膜前提高了50.2%;平均透过率净增加8%以上,达到了很好的增透保护效果.

参考文献

[1] Borden Michael R;Askinazi Joel .Improving sapphire window strength[J].SPIE,1997,3060:246-249.
[2] Regan Thomas M;Harris Daniel C;Stroud Rhonda M et al.Compressive strengthening of sapphire by neutron irradiation[J].SPIE,2001,4375:31-40.
[3] Johnson Linda F;Moran Mark B .Compressive coatings for strengthened sapphire[J].SPIE,1999,3705:130-141.
[4] Schmid F.;Harris DC. .Effects of crystal orientation and temperature on the strength of sapphire[J].Journal of the American Ceramic Society,1998(4):885-893.
[5] Harris Daniel C .Overview of progress in strengthening sapphire at elevated temperature[J].SPIE,1999,3705:5-6.
[6] 张随新;陈国平 .磁控反应溅射氧化锡膜的工艺研究[J].真空科学与技术,1995,15(06):415-419.
[7] 沃森 J L;克恩 W.薄膜加工工艺[M].北京:机械工业出版社,1987
[8] Wei-Tang Li;David R. McKenzie;William D. McFall;Qi-Chu Zhang .Effect of sputtering-gas pressure on properties of silicon nitride films produced by helicon plasma sputtering[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2001(1):46-52.
[9] Harris Daniel C;Schmid Frederick;Black David R et al.Factors that influence mechanical failure of sapphire at high temperature[J].SPIE,1997,3060:226-234.
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