用闭合场非平衡磁控溅射离子镀(CFUBMIP)系统沉积制备CrN硬质薄膜,通过调节偏压改变薄膜沉积过程中离子轰击能量.采用XRD分析薄膜的相结构,结合SEM和AFM对薄膜表面形貌和截面结构的观察,探讨离子轰击能量对CrN硬质薄膜生长方式以及取向的影响规律.结果表明,随着偏压从-60 V增大到-90 V,薄膜始终由CrN单相组成,且均呈柱状生长,但生长择优取向从(200)向(111)转变.偏压的变化主要通过改变离子轰击能量影响薄膜的生长机制,低偏压时以表面能主导,因此呈(200)择优取向生长,而高偏压时以应变诱导生长机制为主,呈(111)择优取向生长.
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