采用TE015模高Q圆柱腔对X波段低损耗介质材料的复介电常数进行了变温测试,电场的极化方向平行于样品表面.可测温度范围为常温到200℃.在所有温度点上,空腔的无载品质因数均大于40000.复介电常数的测试范围为εr:1.05～10,tanδ:3×10-2～5×10-5,测试系统的最可几误差为|Δεr / εr|=1.5% ,|Δtanδ|=10% tanδ+3.0×10-5.
参考文献
| [1] | BAKER-JARVIS J;JANEZIC M;RIDDLE B.Dielectric and conductor-loss characterization and measurements on electronic packaging materials[M].NIST Technical Note 1520,2001 |
| [2] | GB/T 5597-1999.GB/T 5597-1999.固体电介质微波复介电常数的测试方法[S].,1999-12-01. |
| [3] | 周清一.微波测量[M].北京:国防工业出版社,1964 |
| [4] | Kobayashi Y;SHIMIZU T.Millimeter wave measurements of temperature dependence of complex permittivity of dielectric plates by a cavity resonance method[A].,1999:1885-1888. |
| [5] | Zhang G;NAKAOKAS;KOBAYASHI Y.Millimeter wave measurements of temperature dependence of complex permittivity of dielectric plates by the cavity resonance method[A].,1997:3913-3916. |
| [6] | Shimizu T;KOBAYASHI Y.Millimeter wave measurements of temperature dependence of complex permittivity of GaAs disks by a circular waveguide method[A].,2001:2195-2198. |
| [7] | 张其劭;李恩;郭高凤.低损耗电介质复介电常数宽频带测试技术[A].,2002:30-36. |
| [8] | 汤世贤.微波测量[M].北京:电子工业出版社,1990 |
上一张
下一张
上一张
下一张
计量
- 下载量()
- 访问量()
文章评分
- 您的评分：
-
10%
-
20%
-
30%
-
40%
-
50%