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本文采用直流磁控溅射方法,在特殊的含氧气氛条件下,用高纯铂靶在氧化铝陶瓷基板上制备出高性能铂薄膜热敏电阻.利用扫描电子显微镜对铂电阻薄膜微观组织进行分析,利用X射线衍射分析仪对薄膜的物相及晶粒尺寸进行标定.测定薄膜铂电阻的阻温特性曲线,计算电阻温度系数(TCR)值.结果表明:含氧气氛下直流磁控溅射制备的薄膜铂电阻经过高温处理后完全脱氧,得到纯度高、结构致密均匀、附着强度高、热敏电阻性能优异的高性能铂薄膜电阻.

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