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在对傅里叶红外光谱仪与传统的色散型光谱分析仪进行比较的基础上,综述了基于该装置的高温红外光谱发射率测量技术的国内外发展现状.在详细介绍各具特色的装置结构、工作原理、测量温度范围和测量水平的同时,评述了这项技术的特点和局限性,并对其未来发展趋势进行了展望.

参考文献

[1] 褚载祥.材料发射率测量技术[J].红外研究,1986(5A):231-239.
[2] 王海燕,吴坚业,朱国荣.红外发射材料光谱发射率的测量法[J].红外技术,2003(06):61-63.
[3] Wolfgang Bauer;Alexander Moldenhauer;Hansjochen Oertel.Thermal radiation properties of different metals[A].,2006:E-1-E-12.
[4] Lindermeir E;Tank V;Haschberger P.Contactless measurement of the spectral emissivity and temperature of surfaces with a Fourier transform infrared spectrometer[A].,1992:354-364.
[5] Tank V;Lindermeir E;Dietl H .Calibration of a fourier transform spectrometer using three black body sources[J].SPIE,1991,1575:241-243.
[6] Oertel H;Bauer W .Facility for the measurement of spectral emissivities of bright metals in the temperature range from 200 to 1 200℃[J].High Temperature and High Pressure,1998,30(05):531-536.
[7] Bauer Wolfgang;Rink Matthias;Smit Kobus.Determination of spectral and total emissivities of different new steel qualities[A].,2003:31-40.
[8] Bauer W;Oertel H;Rink M.Spectral emissivities of metal surfaces[A].Berlin,Germany,2001:301-306.
[9] Bauer Wolfgang;Rink Matthias.Device for spectral emissivity measurements of ceramics using a FT-IR-spectrometer[A].,2004:340-351.
[10] Markham J R;Kinsella K;Carangelo R M et al.A bench top FT-IR based instrument for simultaneously measuring surface spectral emittance and temperature[J].Review of Scientific Instruments,1993,64:2515-2522.
[11] Ravindra N.M.;Abedrabbo S. .Temperature-dependent emissivity of silicon-related materials and structures[J].IEEE Transactions on Semiconductor Manufacturing: A Publication of the IEEE Components, Hybrids, and Manufacturing Technology Society, the IEEE Electron Devices Society, the IEEE Reliability Society, the IEEE Solid-State Circuits Council,1998(1):30-39.
[12] Ravindra N.M.;Abedrabbo S. .Radiative properties of SIMOX[J].IEEE Transactions on Components, Packaging, and Manufacturing Technology. Part A,1998(3):441-449.
[13] Sudarshan P. Bharadwaj;Michael F. Modest;Robert J. Riazzi .Medium Resolution Transmission Measurements of Water Vapor at High Temperature[J].Journal of heat transfer: Transactions of the ASME,2006(4):374-381.
[14] Hanssen L;Mekhontsev S;Khromchenko V.Infrared spectral emissivity characterization facility at NIST[A].,2004:285-293.
[15] Hanssen L;Kaplan S .Linearity characterization of NIST 's infrared spectral regular transmittance and reflectance scales[J].SPIE,2003,4826:21-26.
[16] Ishii J;Ono A.Fourier transform spectrometer for thermal-infrared emissivity measurements near room temperatures[A].,2000:126-132.
[17] Ishii J;Ono A .Uncertainty estimation for emissivity measurements near room temperature with a Fourier transforms spectrometer[J].Measurement Science and Technology,2001,12:2103-2112.
[18] Yajima D;Ohnishi A;Nagasaka Y.Simultaneous measurement method of normal spectral emissivity and optical constants at high temperatures[A].,2003:22-27.
[19] Zhang B;Redgrove J;Clark J .A transient method for total emissivity determination[J].International Journal of Theoretical Physics,2004,25(02):423-438.
[20] Zhang B;Redgrove J;Clark J.A transient method for total emissivity estimation[A].,2003
[21] [OL].http://www.npl.co.uk/thermal/tpservices.html
[22] Dai Jingmin;Wang Xinbei;Yuan Guibin .Fourier transform spectrometer for spectral emissivity measurement in the temperature range between 60 and 1500℃[J].Journal of Physics:Condensed Matter,2005,13:63-66.
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