利用直流磁控溅射法制备了两组ZAO薄膜,使用60Co放射源对一组薄膜进行了γ射线辐照,在原子氧地面模拟设备中对另一组进行了原子氧辐照,并对辐照前后的样品进行了微观结构、表面形貌及电学特性的表征.结果表明,较高剂量率的γ射线辐照会降低薄膜的结晶程度,而低剂量率的辐照有相反作用.γ射线可激发薄膜中的电子,提高其载流子浓度,最大比率为16.39%.AO辐照仅对ZAO薄膜的表面具有氧化效应,导致表面化学成分中晶格氧比例的提高和薄膜载流子浓度的下降.随着薄膜厚度的增大,载流子浓度的下降比例逐渐减小.
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