建立了铁电液晶SmC*相介电特性的分子理论,求出在外加交变电场作用下液晶系统的自由能密度,得到极化强度〈P-〉和复介电常数ε*的近似表达式.结果表明ε*是外加交变电场的角频率、幅值、温度以及液晶的分子结构参数的函数.
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