利用微细加工技术和双向薄膜沉积技术对钼尖场发射阵列阴极的工艺进行了较为细致的研究,并在专用的真空系统中对所得阵列阴极的发射性能进行了测试,得到了一定的场致发射电流密度值.测试中采用数据采集系统监测栅极电压、阳极电压、阳极电流和栅极电流,测量了阴极阵列的发射稳定性和发射噪声.对发射的失效机理进行了实验研究和分析,认为发射失效的主要原因在于栅极和基底之间的漏电,尖锥和栅极孔间的暗电流,电极间的放电和放气,以及环境真空度和尖锥的不均匀性等.所得结果对进一步开展在射频器件和显示器件方面的应用研究打下了一定基础.
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