利用射频磁控溅射方法,真空室中充入高纯N2(99.99 %)和高纯Ar(99.99 %)的混合气体,在n型(100)Si基底上沉积了氮化硼(BN)薄膜.红外光谱分析表明,BN薄膜结构为六角BN(h-BN)相(1 380 cm-1和780 cm-1).在超高真空(<10-7 Pa)系统中测量了BN薄膜的场发射特性,发现沉积时氮气分压的变化对BN薄膜的场发射特性有很大影响.随着氮气分压的增加,阈值电场逐渐升高,这是由于表面粗糙度的变化造成的.充入10 % N2情况下沉积的BN薄膜样品的场发射特性较好,开启电场为9 V/μm,当电场升高到24 V/μm,场发射电流为320 μA/cm2.所有样品的场发射FN曲线均近似为直线,表明电子是通过隧道效应穿透BN薄膜表面势垒发射到真空的.
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