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采用直流磁控反应溅射法,在3种衬底上获得c轴(002)定向生长的ZnO薄膜,并利用X射线衍射、PL谱对上述薄膜进行了实验研究.结果表明N型(100)Si衬底上,ZnO(002)取向度最高,分析认为是由于N型(100)Si与ZnO(002)晶格匹配度高所致.

参考文献

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