将光学外差法应用于液晶器件扭曲角与光延迟的测试, 提出了测试系统的光路简图,推导出了外差式测试方程,并对此方程进行了数值模拟与分析.此方法将液晶层的相位差转化为光学拍频信号的相位,由传统方法的测量光强转为测量拍频信号的相位差,能克服传统方法的缺点,因此具有较高的精度与抗干扰性.
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