提出了一种新的测量扭曲向列相液晶盒盒厚和扭曲角的Stokes矢量法.根据Jones矩阵推导出了Stokes矢量与液晶盒参数的关系,其原理是通过确定经过液晶盒之后偏振光的偏振特性来求解液晶盒盒厚和扭曲角.该方法在测量一个Stokes矢量时,在液晶盒后依次放两种波片,目的是改变经过液晶盒后的光的偏振态,再置一偏振分光棱镜分开水平Ip和垂直Is,线偏振分量,测得两组光强,根据公式算得该Stokes矢量.从而求解液晶盒盒厚以及扭曲角.实验中我们用该方法测量了不同盒厚、扭曲角度的TN液晶盒.实验结果证明该方法可行,结果准确,并且可以测量盒厚较小的液晶盒.最后,我们理论分析了实验误差.
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