本文用射频反应磁控溅射制备了SiCN薄膜,对薄膜的化学成分、结构进行了研究.结果表明,反应气体N2、Si、C三者之间形成了Si-C、Si-N和C-N键,构成了复杂的网络结构.成分分析表明薄膜的化学计量式近似为SiCN.对比分析了反应溅射制备SiCN、CNx、SiNy和SiCz薄膜的FTIR谱.
参考文献
[1] | LIU A Y;COHEN M L .[J].,1989,245:841. |
[2] | GOMEZ F J;PRIETO P;ELIZALDE et al.[J].Applied Physics Letters,1996,69:773. |
[3] | Lin DY.;Huang YS.;Jong YC.;Chen YF.;Chen LC.;Chen CK.;Chen KH.;Bhusari DM.;Li CF. .TEMPERATURE DEPENDENCE OF THE DIRECT BAND GAP OF SI-CONTAINING CARBON NITRIDE CRYSTALLINE FILMS[J].Physical Review.B.Condensed Matter,1997(11):6498-6501. |
[4] | Senemaud C.;Dufour G.;Herlin N.;Gheorghiu-de la Rocque A. .Effects of heat treatment on the electronic structure of nanometric Si/C/N powders by x-ray photoelectron spectroscopy[J].Journal of Applied Physics,1998(9):4945-4950. |
[5] | Machorro R.;Soto G.;Cota L.;Samano EC. .SiCxNy thin films alloys prepared by pulsed excimer laser deposition[J].Applied Surface Science: A Journal Devoted to the Properties of Interfaces in Relation to the Synthesis and Behaviour of Materials,1998(0):564-568. |
[6] | BARATON M I;CHANG W;KEAR B H .[J].Journal of Physical Chemistry,1996,100:16647. |
[7] | 刘世宏;王当憨;潘承瑛.X射线光电子能谱分析[M].北京:科学出版社,1989 |
[8] | Besling WFA.;Meester B.;Schoonman J.;Goossens A. .Laser-induced chemical vapor deposition of nanostructured silicon carbonitride thin films[J].Journal of Applied Physics,1998(1):544-553. |
[9] | USLU C;PARK B;POKER D B .[J].Journal of ELECTRO MAT,1996,25:23. |
[10] | LUTZ H;BRUNS M;LINK F et al.[J].Thin Solid Films,1998,332:230. |
[11] | Zeze DA.;Crawford RI.;Cui N.;Anderson CA.;Brown NMD.;O'Toole EP. .Characterization of carbon nitride films grown using an inductively-coupled plasma with adamantane as the source hydrocarbon[J].Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films,1998(12):896-902. |
[12] | Kim DS.;Lee YH. .ROOM-TEMPERATURE DEPOSITION OF A-SIC-H THIN FILMS BY ION-ASSISTED PLASMA-ENHANCED CVD[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,1996(1/2):109-118. |
[13] | SMITH A L;ANDERSON D R .[J].Applied Spectroscopy,1984,38:822. |
[14] | ALEXANDRESCU R;MORJAN I;BORSELLA E et al.[J].Journal of Materials Science,1991,6:2442. |
[15] | HE X M;SHU L;LI W Z et al.[J].Journal of Materials Research,1997,12:1595. |
[16] | WEI A X;CHEN D H;KE N et al.[J].Thin Solid Films,1998,323:217. |
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