采用 LaNiO3陶瓷靶和射频磁控溅射技术在 350℃的 K9玻璃衬底上制备出了具有较好( 100) 择优取向的 LaNiO3薄膜.通过对不同厚度薄膜的光学、电学以及薄膜结构等物理特性的测试分析, 发现薄膜厚度小于 100nm时为非晶结构,厚度大于 150nm后出现了具有( 100)择优取向的 LaNiO3 相.非晶结构的 LaNiO3具有较高的面电阻和高的光学透射率,而晶化的 LaNiO3薄膜具有类似于金 属的导电能力和光学特性.薄膜的生长动力学和导电分析结果认为薄膜生长的初期会形成一个非 晶过渡层.
参考文献
[1] | Miyake S;Fujihara S;Kimura T .Characteristics of oriented LaNiO3 thin films fabricated by the sol- gel method[J].Journal of the European Ceramic Society,2001,21:1525-1528. |
[2] | Lee HY.;Wu TB. .Crystallization kinetics of sputter-deposited LaNiO3 thin films on Si substrate[J].Journal of Materials Research,1998(8):2291-2296. |
[3] | WU Di;Li A;Liu Z et al.Fabrication and electrical property of sol-gel derived (BaSr)TiO3 thin films with metallic LaNiO3 electrode[J].Thin Solid Films,1998,336:172-175. |
[4] | Rajeev K P;Shivashankar G V;Raychaudhuri A K .Low- temperature electronic properties of a normal conducting perovskite oxide (LaNiO3)[J].Solid State communications,1991(79):591-595. |
[5] | Zhang Z Y;Lagally M G .Atomistic processes in the early stages of thin film growth[J].Science,1997,276:377-383. |
[6] | Sá nchez R D;Causa M T;Caneiro A et al.Metal- insulator transition in oxygen- deficient LaNiO3- x Perovsites[J].Physical Review B,1996,54(23):16574-16578. |
[7] | Torrance J B;Lacorre P;Nazzal A I .Systematic study of insulator- metal transitions in perovskites RniO3 (R=Pr Nd, Sm, Eu) due to closing of charge- transfer gap[J].Physical Review B,1992,45(14):8209-8212. |
上一张
下一张
上一张
下一张
计量
- 下载量()
- 访问量()
文章评分
- 您的评分:
-
10%
-
20%
-
30%
-
40%
-
50%