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用磁控溅射系统和快速合金化法制备了Au/Ti/W/Ti多层金属和n-GaAs材料的欧姆接触,用传输线法对其比接触电阻进行了测试,并利用俄歇电子能谱(AES)和X射线衍射图谱(XRD)对接触的微观结构进行了研究.结果表明该接触在700℃时比接触电阻为1.5×10-4Ω@cm2,快速合金化后呈现欧姆特性可能与接触界面处生成的TiAs相有关.

参考文献

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