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采用溶胶-凝胶(sol-gel)工艺分别在Pt/Ti/SiO2/Si和LNO/Si电极上制备Pb(Zr0.53Ti0.47)O3(PZT)铁电薄膜.研究了不同电极材料对PZT铁电薄膜的微结构及电性能的影响.(100)择优取向的PZT/LNO薄膜的介电性能和铁电性能较(111)/(100)取向的PZT/Pt薄膜略有下降,但在抗疲劳特性和漏电流特性方面都有了很大提高.PZT/LNO薄膜1010次极化反转后剩余极化几乎保持未变,直至1012次反转后,剩余极化仅下降了17%.

参考文献

[1] Haertling G H .Recent development in bulk and PLZT material and devices[J].Ferroelectrics,1992,131:1-12.
[2] Klee M;Eusemann R;Wasre R et al.Processing and electrical properties of Pb (ZrxTi1 -x)O3(x = 0.2 ~ 0. 75)films: comparison of metallo - organic decomposition and sol-gel process[J].Journal of Applied Physics,1992,72(04):1566-1576.
[3] Wang ZJ.;Chu JR.;Maeda R.;Kokawa H. .Effect of bottom electrodes on microstructures and electrical properties of sol-gel derived Pb(Zr0.53Ti0.47)O-3 thin films[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2002(1/2):66-71.
[4] Pollak C.;Reichmann K.;Hutter H. .Comparative study of LNO, LSCO and LSMO as electrode layers for microelectronic capacitors by dynamic SIMS[J].Surface & Coatings Technology,2002(2/3):119-124.
[5] Meng XJ.;Sun JL.;Bo LX.;Ye HJ.;Guo SL.;Chu JH.;Ma ZX. .Highly oriented PbZr0.3Ti0.7O3 thin film on LaNiO3-coated Si substrate derived from a chemical solution technique[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2000(1/2):271-275.
[6] Meng XJ.;Sun JL.;Ye HJ.;Guo SL.;Chu JH.;Cheng JG. .Growth of (100)-oriented LaNiO3 thin films directly on Si substrates by a simple metalorganic decomposition technique for the highly oriented PZT thin films[J].Journal of Crystal Growth,2000(1/2):100-104.
[7] Chae BG.;Yang YS.;Lee SH.;Jang MS.;Lee SJ.;Kim SH.;Baek WS.;Kwon SC. .Comparative analysis for the crystalline and ferroelectric properties of Pb(Zr,Ti)O-3 thin films deposited on metallic LaNiO3 and Pt electrodes[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2002(1/2):107-113.
[8] Kim Seung Hyun;Park D Y et al.Orientation effects in chemical solution derived PbZr0. 3Ti0.7 thin films on ferro electric properties[J].Thin Solid Films,2002,416:264-270.
[9] Kim WS.;Park HH.;Yang JK. .Influence of preferred orientation of lead zirconate titanate thin film on the ferroelectric properties[J].Applied Surface Science: A Journal Devoted to the Properties of Interfaces in Relation to the Synthesis and Behaviour of Materials,2001(0):549-552.
[10] Tang X G;Chan H L W;Ding A L et al.Processing effects on the microstructure and ferroelectric properties of Pb(Zr, Ti)O3 thin films prepared by sol- gel process[J].Surface and Coatings Technology,2002,161:169-173.
[11] Feng Yan;Peng Bao;Helen L W Chan .The grain size effect of PbZr0.3Ti0.7 thinfilms[J].THIN SOLID FILMS,2002,406:282-285.
[12] Jun -Kyu Yang;Woo Ski Kim;Hyung - Ho Park et al.Effect of grain size of Pb(Zr0.4Ti0.6)O3 sol -gel derived thin films on the ferroelectric properties[J].Applied Surface Science,2001,169-170:544-548.
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