欢迎登录材料期刊网

材料期刊网

高级检索

采用射频磁控溅射法在石英玻璃衬底上制备出均匀透明的SrBi2Ta2O9(SBT)薄膜,根据透射谱计算表明薄膜样品厚度为349nm,线性折射率为3.05.以锁模Nd:YAG激光器作为光源,利用Z-scan技术测定了薄膜的非线性光学性能.结果表明薄膜的非线性折射率n2=2.56×10-8esu,非线性光吸收系数β=3.93×10-4 esu,其三阶非线性极化率的实部和虚部分别为:Reχ(3)=8.29×10-9 esu和Imχ(3)=1.08×10-9 esu.

参考文献

[1] Wessels BW. .Ferroelectric oxide epitaxial thin films: synthesis and non-linear optical properties[J].Journal of Crystal Growth,1998(1/4):706-710.
[2] Guang Yang;Weitian Wang;Lei Yan et al.Z-scan determination of the large third-order optical nonlinearity of Rh:BaTiO3 thin films deposition on MgO substrates[J].Optics Communications,2002,209:445-449.
[3] Weitian Wang;Guang Yang;Zhenghao Chen;Yueliang Zhou;Huibin Lu;Guozhen Yang .Iron nanoparticles in amorphous BaTiO_(3) thin films with large third-order optical nonlinearity[J].Journal of Applied Physics,2002(12):7242-7245.
[4] Zhang WF.;Zhang MS.;Huang YB. .Optical properties of ferroelectric (Pb, La) (Zr, Ti) O-3 thin films grown by pulsed laser deposition[J].Applied Surface Science: A Journal Devoted to the Properties of Interfaces in Relation to the Synthesis and Behaviour of Materials,2000(3/4):185-189.
[5] W. F. Zhang;M. S. Zhang;Z. Yin .Large third-order optical nonlinearity in SrBi_(2)Ta_(2)O_(9) thin films by pulsed laser deposition[J].Applied physics letters,1999(7):902-904.
[6] Manifacier J C;Gasiot J;Fillard J P.A simple method for the determination of the optical constants n,k and the thickness of a weakly absorbing thin film[J].Journal of Physics E:Scientific Instruments,1976(09):1002-1004.
[7] Dinghua Bao;Xiaoqing Wu;Liangying Zhang;Xi Yao .Preparation, electrical and optical properties of (Pb, Ca) TiO_3 thin films using a modified sol-gel technique[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,1999(12):30-37.
[8] Sheik-Bahae M.;Said A.A. .Sensitive measurement of optical nonlinearities using a single beam[J].IEEE Journal of Quantum Electronics: A Publication of the IEEE Quantum Electronics and Applications Society,1990(4):760-769.
[9] Yin M.;Tang SH.;Ji W.;Li HP. .Determination of nonlinear absorption and refraction by single Z-scan method[J].Applied physics, B. Lasers and optics,2000(4):587-591.
上一张 下一张
上一张 下一张
计量
  • 下载量()
  • 访问量()
文章评分
  • 您的评分:
  • 1
    0%
  • 2
    0%
  • 3
    0%
  • 4
    0%
  • 5
    0%