用热化学气相沉积法在阳极氧化4min的钛片上直接生长了有序碳纳米管束阵列.扫描电镜和透射电镜表征分析证明碳纳米管呈有序束状,管束由缠绕的碳纳米管组成.用半导体参数测试仪测得的电流-电压特性曲线接近线性,表明碳纳米管和钛片间近似欧姆接触.X射线衍射(XRD)表明TiC层的存在,进而通过对C-Ti二相图的分析确定TiC层是实现碳纳米管与钛基底近似欧姆接触的原因.用交流阻抗和循环伏安研究了碳纳米管阵列的电化学性质,证明其具有良好的电容特性.
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