本文不同的温度下制备多孔硅.通过荧光光谱、光吸收谱、X射线光电子谱研究了多孔硅的光和结构特性.研究结果表明存在着一个制备临界温度343 K,当制备温度从临界温度之下提高到临界温度之上时,多孔硅的荧光和光吸收从红移转向蓝移,同时硅2p电子结合能也从减小转向增大.
The porous silicon (PS) samples were prepared at different anodization temperature. Photolu-minescence, photo- absorbance, and X- ray photoelectron spectroscopies were used to study the struc-tural and optical behavior of the PS. The results showed that an optical transition of porous silicon from red shift to blue shift, and Si -2p binding energy transition from low to high at a critical anodization tem-perature, 343 K.
参考文献
[1] | Gaburro Z.;Babic D.;You HD. .Effect of resistivity and current density on photoluminescence in porous silicon produced at low HF concentration[J].Journal of Applied Physics,1998(11):6345-6350. |
[2] | Kordas K.;Beke S.;Hu T.;Leppavuori S.;Remes J. .Manufacturing of porous silicon; porosity and thickness dependence on electrolyte composition[J].Applied Surface Science: A Journal Devoted to the Properties of Interfaces in Relation to the Synthesis and Behaviour of Materials,2001(1/4):190-193. |
[3] | Koshida N;Koyama H .Photoluminescent and eleetroluminescent properties of porous silicon[J].Nanotechnology,1992,3:192-195. |
[4] | Ono H;Gomyou H;Morisaki H et al.Effects of Anodization Temperature on Photoluminescence from Porous Silicon[J].Journal of the Electrochemical Society,1993,140(12):L 180-LL182. |
[5] | Setzu S.;Romestain R.;Lerondel G. .Temperature effect on the roughness of the formation interface of p-type porous silicon[J].Journal of Applied Physics,1998(6):3129-3133. |
[6] | D. J. Blackwood;Y. Zhang .The effect of etching temperature on the photoluminescence emitted from, and the morphology of, p-type porous silicon[J].Electrochimica Acta,2003(6):623-630. |
[7] | The etching solution will evaporate and PS can't be fabricated at anodization temperature higher than 363 K[Q]. |
[8] | Andersen OK.;Veje E. .EXPERIMENTAL STUDY OF THE ENERGY-BAND STRUCTURE OF POROUS SILICON[J].Physical Review.B.Condensed Matter,1996(23):15643-15652. |
[9] | Theiss W.Scout Thin Film Analysis Software Handbook[M].Aachen,Germany:M.Theiss-Hard-and Software for optical spectroscopy,2001 |
[10] | Theiβ W .Optical properties of porous silicon[J].Surface Science Reports,1997,29(3 -4):91-192. |
[11] | Furukawa S;Miyasato T .Quantum size effects on the optical band gap of mieroerystalline Si:H[J].Physical Review B,1988,38(08):5726-5729. |
[12] | Guha S.;Lang W.;Steiner P. .RESONANT RAMAN SCATTERING AND PHOTOLUMINESCENCE STUDIES OF POROUS SILICON MEMBRANES[J].Journal of Applied Physics,1996(11):8664-8668. |
[13] | L. K. Pan;Chang Q. Sun .Coordination imperfection enhanced electron-phonon interaction[J].Journal of Applied Physics,2004(7):3819-3821. |
上一张
下一张
上一张
下一张
计量
- 下载量()
- 访问量()
文章评分
- 您的评分:
-
10%
-
20%
-
30%
-
40%
-
50%