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用单光束扫描法研究薄膜材料的非线性光学性质时,如果 入射样品的激光功率过大,将会烧蚀薄膜而产生孔洞,虽然其归一化 透过率曲线类似于没有烧蚀的情况,但与样品的非线性光学性质无 关,因而造成测量结果错误。本文从理论上分析了因孔洞而产生的正 透镜或负透镜效应并给出了归一化透过率的表达式。

During the measurement of optical nonlinearities of sample in the thin film by Z-scan technique, ablating makes a hole in the thin film if the incidental laser power is too high, that will produce the error to measurement results. We analyze the positive and negative lens effect caused by the hole theoretically and give the expression of normalized transmittance in this condition.

参考文献

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[2] Yang Lina, Dorsinville R, Wang Q Z et al. Excite-state nonlinearity in polythiophene thin films investigated by the Z-scan technique. Optics Letters, 1992, 17(5): 323~325
[3] Wang Q, Zhang Chungping. Optical limiting by chemically enhanced bacteriorhodopsin films. Optics Letters, 1993, 18(10): 775~777
[4] Michelotti F, Fazio E, Senesi F et al. Nonlinearity and photostructural changes in glassy As2S2 thin films. Optics Communications, 1998, 101(1): 74~78
[5] Patterson B M, White W R, Robbins T A et al. Linear optical effects in Z-scan measurements of thin films. Applied Optics, 1998, 37(10): 1854~1857
[6] 贾振红,李劬,陈益新等. Z扫描测 量中的热致非线性效应. 光学学报, 1996, 16(5): 635~639
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