温度特性是影响半导体激光器(LD)特性测试准确性的重要因素,对LD温度控制技术的研究有着重要的意义.在分析了LD的温度特性的基础上,提出了一种高稳定温度控制的设计方案,并从几个方面讨论了保证LD高稳定温度控制和保证温度信号检测、传输精度的方法.实验结果表明,在10℃～40℃范围内温度稳定度为±0.01℃,在25℃时稳定度达到士0.005℃,从而为LD的准确测试提供了有效的保证.此系统稍加改动即能广泛应用于各类LD的控温系统.
参考文献
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