报道了利用光纤中的自相位调制(SPM)效应对微结构光纤的非线性系数进行测量的实验.实验中采用半导体激光器作为脉冲光源,输出宽度为1.6 ps的双曲正割型脉冲,经掺铒光纤放大器(EDFA)放大后进入80 m的色散平坦微结构光纤,由于自相位调制效应,出射光谱得到展宽.通过测量输入微结构光纤的脉冲峰值功率和输出光谱,可以计算得到微结构光纤的非线性系数.该测量方法简单、准确,实验测量值与光纤的标称值误差小于1%.
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