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以聚酰亚胺(HQDDA-0DA)为基体,正硅酸乙酯(TEOS)为增强剂,在共溶DMF中,通过溶胶-凝胶法,制备出厚度约为20μm,不同含量SiO2的PI/SiO2杂化膜,用Fr-IR、SEM及万能拉力实验机对膜材料的微观结构和力学性能表征.结果表明,杂化膜中Si-OH和PI存在化学键;10%SiO2含量的杂化膜SiO2颗粒呈卵形镶嵌在PI基体中,取向与膜平行,随着SiO2含量的增加,颗粒尺寸增大,30%SiO2含量的杂化膜中,无机相形成部分的连续结构,并出现团聚;10%SiO2含量的杂化膜强度和模量均为最大,随着SiO2含量的进一步增加的膜的强度与模量均下降.

参考文献

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