采用溶胶-凝胶技术通过添加Ce(NO3)3制备了掺杂Ce3+离子的纳米SiO2材料,利用红外光谱、紫外-可见吸收光谱以及电子能谱等研究样品成分,并对不同热处理条件下样品的光致发光性能进行研究.结果表明,低温处理条件下样品中存在一定量的OH羟基,并且样品中的Ce离子主要以Ce3+的形式存在.在100-500℃较低温度下热处理的样品中存在两个峰值相近的光致发光带,最大值为344nm和357nm,其对应的最大激发峰分别为226nm和252nm.其中,344nm光致发光带起源于基体SiO2的缺陷中心,而357nm光致发光带起源于Ce3+的一种类液发光.
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