论文采用等温衰减电流法研究了在不同烧结温度下制备的陶瓷试样的陷阱分布.试验结果表明,烧结温度能够影响到氧化铝陶瓷介质的陷阱分布.微观结构分析表明,不同的烧结温度会导致陶瓷介质不同数量的结构缺陷,从而造成了它们陷阱分布的不同.
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