基于静电力显微镜(EFM)设计了一套在微纳米尺度下观察研究电介质表面电荷的系统.该系统设有温度和湿度调节系统,可实现不同气体环境,并可模拟紫外照射功能.该系统为电介质表面电荷的研究提供了一种新的手段,为从微观尺度解释表面电荷的生成和行为特性提供了新的途径.
参考文献
[1] | Ahmed N H;Srinivas N N.Review on Space Charge Measurements in Dielectrics[J].IEEE Trans Dielectrics and Electricel Insulation,1997(04):644-656. |
[2] | Wintle H J.Theory of the Potential Probe Used in Static Electrification Measurements on Insulators[J].Journal of Physics E,1970(03):334-336. |
[3] | Khalil M.S.;Hansen B.S. .Investigation of space charge in low-density polyethylene using a field probe technique[J].IEEE transactions on electrical insulation. (Institute of Electrical and Electronics Engineers. Electrical Insulation Group). New York.,1988(3):441-445. |
[4] | Lang S B;Das-gupta D K.Laser Intensity Modulation Method:A Technique for Determination of Special Distributions of Polarization and Space Charge in Polymer Electrets[J].Journal of Applied Physics,1986(59):2151-2160. |
[5] | Ng C Y;Chen T P;Lau H W.Visualizing Charge Transport in Silicon Nanocrystals Embedded in SiO2 Films with Electrostatic Force Microscopy[J].Applied Physics Letters,2004(85):2941-2943. |
[6] | Martin Y;Abraham D W;Wickramasinghe H K.Highresolution Capacitance Measurement and Potentiometry by Force Microscopy[J].Applied Physics Letters,1988(52):1103-1105. |
[7] | Dianoux R.;Martins F.;Marchi F.;Alandi C.;Comin F.;Chevrier J. .Detection of electrostatic forces with an atomic force microscope: Analytical and experimental dynamic force curves in the nonlinear regime - art. no. 045403[J].Physical review, B. Condensed matter and materials physics,2003(4):5403-0. |
上一张
下一张
上一张
下一张
计量
- 下载量()
- 访问量()
文章评分
- 您的评分:
-
10%
-
20%
-
30%
-
40%
-
50%