以稻壳为原料制备纳米结构SiO2,并用X-射线衍射、扫描电镜、透射电镜以及小角X-射线散射对其结构进行了表征.结果表明,由稻壳制备的SiO2具有分层结构:由硅氧四面体无规连接构成粒径为4nm左右、表面分形维数Ds≈2.3的一次粒子;一次粒子聚集成粒径30～50nm、质量分形维数Dm≈2.7的二次粒子.
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