运用小角X-射线散射(SAXS)技术,定量地分析了杂化介孔二氧化硅产物SiO2骨架、介观孔洞以及纳米结构整体的分形维数在陈化处理过程中的演变过程.结果表明,SiO2骨架电子不平均区尺度(E)、孔洞回旋半径(Rg)和整体质量分形(DM)尺度数目都呈逐渐减少的趋势,标志着在陈化处理过程中产物整体结构规整程度逐步得到提高.
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