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利用射频磁控溅射法在Si(111)衬底上先溅射ZnO缓冲层,再溅射Ga2O3薄膜,然后在开管炉中不同温度下通氨气进行氨化反应生长GaN薄膜.分析结果表明,利用该方法制备的GaN薄膜是六角纤锌矿多晶结构,并且随着氨化温度的升高,GaN薄膜向棒状和线状形态转变.同时分析了ZnO缓冲层对形成GaN纳米结构的影响.

参考文献

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