氧化铟锡(ITO)粉体中的微量杂质元素对其薄膜制品的透光率等光谱特性影响较大.用电感耦合等离子体发射光谱法(ICP-OES)同时测定ITO粉体中Sn, Fe, Cu, Pb, Zn, Ca, Mg共7种微量元素.样品置于银坩埚中用氢氧化钠铺底和覆盖,高温碱法熔融,用热水和稀盐酸浸取并转移至溶液中;选择合适谱线消除了元素之间的谱线干扰、配制混合标准溶液时采用基体匹配法消除了基体干扰;对每种元素的精密度、检出线和加标回收率进行了研究,试验结果表明,每种元素的精密度均不大于1.2%,加标回收率在98~104%之间,样品测试结果与标准值一致.
Microelements in indium tin oxide(ITO) powders have a great impact on spectrum characteristics such as transmittance of film products.Seven microelements in ITO powders were determined by Inductively Coupled Plasma Optical Emission Spectrometer (ICP-OES).ITO powders were placed in a silver crucible with sodium hydroxide bedding and coverage, and melted by alkali at high temperature.The melt was leached and transferred into the solution with hot water and dilute hydrochloric acid.Matrix interference and spectrum interference between elements were eliminated by choosing the right working conditions.The precision, the detection line and the recovery rate of each element were studied, the results show that the precision of ICP-OES was no more than 1.2%, the recovery rate ranged from 98% to 104%.The results of multiple microelements in ITO sample agreed with the recommend value.
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