采用Sol-Gel方法,通过快速热处理,在Pt/Ti/SiO2/Si衬底上制备出Pb(Zr,Ti)O3成分梯度薄膜.用俄歇微探针能谱仪(AES)对制备的上梯度薄膜进行了成分深度分析,证实其成分梯度的存在.XRD分析表明,制备的梯度薄膜为四方结构和三方结构的复合结构,但其晶面存在一定的结构畸变.介电温谱测试表明,随着温度的升高,梯度薄膜出现一个铁电-铁电相变点和两个居里点,同时出现一定的频率弥散现象.不同偏压下电滞回线的测试表明,梯度薄膜表现出良好的铁电性质.热释电性能测试表明,梯度薄膜的热释电系数随着温度的升高逐渐增加,并且其热释电系数比每个单元的热释电系数大.
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