X-ray Diffraction Line Profile Broadening of Fe_(50)Pd

材料科学技术（英）, 1995, 11(6): 435-439.

X-ray Diffraction Line Profile Broadening of Fe_(50)Pd_(50) Alloy Ultrafine Particles

Jian CHEN , Wenduo WEI , Mingchuan YANG , Xiukui SUN , Wenxiu CHEN and Zhuangqi HU (State Key Lab. of RSA , Institute of Metal Research , Chinese Academy Sciences , Shenyang , 110015 , China)

The composition distribution in Fe50Pd50 alloy ultrafine particles prepared by inert gas condensation method was investigated in details by means of X-ray diffraction technique through deconvolution of the X-ray diffraction data. The microscopic composition distribution in the alloy UFP was identified, which is caused by nonuniformity of the melt, fractional distillation during the evaporation process and statistical fluctuation during nucleation and coalescence of the alloy particles. The composition distribution affects the properties of the alloy UFP

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Jian CHEN Wenduo WEI Mingchuan YANG Xiukui SUN Wenxiu CHEN and Zhuangqi HU (State Key Lab. of RSA Institute of Metal Research Chinese Academy Sciences Shenyang 110015 China)
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Jian CHEN Wenduo WEI Mingchuan YANG Xiukui SUN Wenxiu CHEN and Zhuangqi HU (State Key Lab. of RSA Institute of Metal Research Chinese Academy Sciences Shenyang 110015 China)
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Jian CHEN Wenduo WEI Mingchuan YANG Xiukui SUN Wenxiu CHEN and Zhuangqi HU (State Key Lab. of RSA Institute of Metal Research Chinese Academy Sciences Shenyang 110015 China)

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X-ray Diffraction Line Profile Broadening of Fe_(50)Pd_(50) Alloy Ultrafine Particles

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