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利用磁控溅射法在Si (110)基片上制备了Zn0.95-xLixMn0.05O (x=0,0.05)薄膜,研究了Li掺杂对Mn-ZnO薄膜结构、电学和磁学性能的影响.XRD结果表明,样品薄膜具有高度的c轴择优取向,并且没有发现其他杂相.AFM表明,Li掺入Mn-ZnO使得薄膜颗粒均匀、质地致密.霍尔测试表明,Li掺入Mn-ZnO使载流子浓度增加,然而没有改变其n型导电类型.磁性测试表明,Li掺入Mn-ZnO使得室温铁磁性增强,可由束缚极化极子(BMP)模型解释.

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