通过高压扭转(HPT)技术在不同转速条件下实现了Cu试样的晶粒细化.利用光学显微镜(OM)、透射电镜(TEM)及显微硬度计观察并测试了组织的结构与性能,并基于有限元计算了变形诱导试样的温升,研究了转速对Cu试样的组织细化与性能的影响.结果表明:转速由1/3 r·min-1增大至1 r·min-1,经1圈扭转变形,试样温度由40.8℃升高到54.1℃,变形组织均为100～600 nm的高位错密度位错胞/亚晶组织,显微硬度由初始态的52HV0.05增大至140 HV0.05;经16圈扭转变形,试样温度由50.4℃升高到97.4℃,组织细化到200 nm.慢速扭转变形试样晶内位错密度高,微观组织处于严重变形状态;而快速扭转试样晶内衬度均匀,位错较少,微观组织经历明显的动态回复,显微硬度较慢速扭转变形试样低6%.
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