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采用脉冲激光沉积系统分别在LaAlO3(001)和MgO(001)衬底上沉积了Ba06Sr04TiO3(BST)薄膜,以Pt做电极分别构架了Pt/BST/MgO和Pt/BST/LaAlO3叉指电容器.利用X射线衍射仪、原子力显微镜和Aglient E4980LCR表分别对两种薄膜的结构、表面形貌和介电特性进行表征.研究发现:两种衬底都可以实现BST(001)薄膜的外延生长,MgO和LaAlO3衬底上BST薄膜的晶粒尺寸分别为52 nm和42 nm.在室温40 V偏置电压下,Pt/BST/MgO和Pt/BST/LaAlO3的调谐率分别为39.68%和29.55%,最低损耗分别为0.029和0.053.这说明衬底材料的晶格常数不同,最终导致了BST薄膜介电性能的不同.

参考文献

[1] Li H;Finder J;Liang Y;Gregory R;Qin W.Dielectric properties of epitaxial Ba0.5Sr0.5TiO3 films on amorphous SiO2 on sapphire[J].Applied physics letters,20057(7):2905-1-2905-3-0.
[2] W. J. Kim;H. D. Wu;W. Chang.Microwave dielectric properties of strained (Ba_(0.4)Sr_(0.6))TiO_(3) thin films[J].Journal of Applied Physics,20009(9):5448-5451.
[3] Panda B;Roy A;Dhar A;Ray SK.Thickness and temperature dependent electrical characteristics of crystalline BaxSr1-xTiO3 thin films[J].Journal of Applied Physics,20076(6):64116-1-64116-7-0.
[4] B. H. Park;E. J. Peterson;Q. X. Jia;J. Lee;X. Zeng;W. Si;X. X. Xi.Effects of very thin strain layers on dielectric properties of epitaxial Ba_(0.6)Sr_(0.4)TiO_(3) films[J].Applied physics letters,20014(4):533-535.
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