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GaN氢化物气相外延(HVPE)生长过程中,衬底表面的温度分布对其生长质量有着重要影响.我们采用计算机模拟,研究了GaN生长过程中所使用的不同结构石墨基座上的温度分布.根据所得不同结构下基座上的温度分布,选择衬底上温度分布最均匀的结构与普通实验使用的基座结构进行实验对比.结果发现,在实际的大流量载气的GaN生长中,采用优化的圆弧凹面结构石墨基座实验组的GaN晶体外延层的生长速率、生长质量和均匀性等比普通方法生长的更好.本文得到的不同HVPE生长环境下的基座结构优化设计方案,为HVPE炉体的设计和氮化物生长具有很好的指导意义.

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