针对分压屏接线及杂散阻抗及容抗会使套管雷电波型式试验响应波形产生畸变的问题，通过测量套管电容值及分析电压波形的频谱信息，利用短时傅里叶变化对特定时间段的频谱信息进行分析，判断试验过程中套管是否发生层间击穿现象。结果表明：杂散阻抗会使分压屏两端电压波形在雷电波型式试验中产生畸变，利用短时傅里叶分析处理分压屏电压在不同时段内的频谱可以判断套管有无发生击穿现象，且击穿层数与频谱极值和幅值变化量有定量关系，在击穿层数较小时该方法相比电容值测量更加准确。
In view of the problem that the bushing tap wiring and stray impedance and captance may cause the lightning response waveform of bushing distortion, we tested the capacitance of bushing and analyzed the frequency spectrum of voltage waveform. The short-time Fourier analysis was used to real-ize the time localization of frequency spectrum, and whether the bushing occured interlayer breakdown phenomena or not can be determined by analyzing the frequency spectrum in certain period of time. The results show that the stray impedance would cause the voltage waveform of two ends of busing tap dis-tortion in the lightning test, and the breakdown phenomena of bushing could be discovered using the short-time Fourier to analyze the frequency spectrum of voltage at different time. And there is a quantita-tive relationship between the number of breakdown layers and the extreme value and amplitude variation of frequency spectrum. This method is more accurate compared to the capacitance measurement when the number of breakdown layers is small.
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