采用了添加抗坏血酸作为还原剂的改良溶胶-凝胶法制备了单相的稀磁半导体Zn1-xFexO(x=0.01、0.05、0.07、0.10) 粉末.X射线衍射谱(XRD)显示所有Zn1-xFexO样品在室温下都呈现出P63mc的六角晶格结构,同时单位晶胞体积呈现出随着Fe离子掺杂量的提高而增大的趋势.X射线光电子能谱(XPS)证明在Zn1-xFexO晶格中的掺杂元素Fe主要以Fe2+的方式存在.比饱和磁化强度(σs)随Fe掺杂量的增加而提高,并在样品Zn0.90Fe0.10O中获得最大值0.43Am2/kg,定性地解释了铁磁性的来源.
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