采用射频磁控溅射技术在石英衬底上制备了Cu2O薄膜.系统研究了衬底温度对薄膜结构、光学和电学性能的影响.XRD的结果显示,在所有衬底温度条件下均可得到单相的Cu2O结构,而且随着衬底温度由500 K升至800 K,薄膜表现出(111)择优取向的生长特点.电学和光学测试结果表明,室温电导率和光学带隙随着衬底温度的升高而增加,800 K制备的薄膜的带隙值最高约为2.58 eV.
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