扫描电子显微镜下单壁碳纳米管的原位操控与性能

材料科学与工程学报, 2009, 27(5): 789-792.

扫描电子显微镜下单壁碳纳米管的原位操控与性能

董幼青 ^1, , 张礼杰 ^2, , 邹超 ^3, , 黄少铭 ^4,

1.温州大学纳米材料与化学重点实验室,浙江温州,325027

2.温州大学纳米材料与化学重点实验室,浙江温州,325027

3.温州大学纳米材料与化学重点实验室,浙江温州,325027

4.温州大学纳米材料与化学重点实验室,浙江温州,325027

基金项目: 国家自然科学基金(50772076)

关键词：纳米操纵仪 , 扫描电子显微镜 , 单壁碳纳米管 , 原位测量 , 纳米操纵

In situ Study on Properties of Single-Walled Carbon Nanotubes by the Nano-Manipulator in a Scanning Electron Microscope

本文利用纳米操纵仪结合扫描电子显微镜系统对单壁碳纳米管进行在线操纵,在此基础上,通过外接的半导体参数测量系统,可以测量单壁碳纳米管的电学性能.此外,通过纳米操纵手对碳纳米管施加外电场,还可以改变二氧化硅表面单壁碳纳米管的扫描电子显微镜成像.

参考文献

[1]	Lianming Tong;Tao Zhu;Zhongfan Liu .Atomic force microscope manipulation of gold nanoparticles for controlled Raman enhancement[J].Applied physics letters,2008(2):023109-1-023109-3-0.
[2]	D. A Walters;L. M. Ericson;M. J. Cassavant;J. Liu;D. T. Colbert;K. A. Smith;R. E. Smalley .Elastic strain of freely suspended single-wall carbon nanotube ropes[J].Applied physics letters,1999(25):3803-3805.
[3]	Prior M;Makarovski A;Finkelstein G .Low-temperature conductive tip atomic force microscope for carbon nanotube probing and manipulation[J].Applied physics letters,2007(5):53112-1-53112-3-0.
[4]	Mingsheng Wang;Jingyun Wang;Qing Chen;Lian-Mao Peng .Fabrication and Electrical and Mechanical Properties of Carbon Nanotube Interconnections[J].Advanced functional materials,2005(11):1825-1831.
[5]	Gang Ma;Yu Ren;Jun Guo;Tan Xiao;Feng Li;Huiming Cheng;Zongrong Zhou;Kin Liao .How long can single-walled carbon nanotube ropes last under static or dynamic fatigue?[J].Applied physics letters,2008(8):083105-1-083105-3-0.
[6]	Huang JY;Chen S;Ren ZF;Wang Z;Kempa K;Naughton MJ;Chen G;Dresselhaus MS .Enhanced ductile behavior of tensile-elongated individual double-walled and triple-walled carbon nanotubes at high temperatures[J].Physical review letters,2007(18):5501-1-5501-4-0.
[7]	XianLong Wei;Qing Chen;Yang Liu .Cutting and sharpening carbon nanotubes using a carbon nanotube 'nanoknife'[J].Nanotechnology,2007(18):185503(1-5).
[8]	Wang MS;Peng LM;Wang JY;Chen Q .Shaping carbon nanotubes and the effects on their electrical and mechanical properties[J].Advanced functional materials,2006(11):1462-1468.
[9]	Peng LM;Wang MS;Wang JY .On the phenomenological nature of the work function as determined from electron field-emission experiments on nanotubes and nanowires[J].Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films,2006(6):1073-1077.
[10]	Larsson MW;Wallenberg LR;Persson AI;Samuelson L .Probing of individual semiconductor nanowhiskers by TEM-STM[J].Microscopy and microanalysis: The official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada,2004(1):41-46.
[11]	Golberg D;Bai XD;Mitome M;Tang CC;Zhi CY;Bando Y .Structural peculiarities of in situ deformation of a multi-walled BN nanotube inside a high-resolution analytical transmission electron microscope[J].Acta materialia,2007(4):1293-1298.
[12]	D. Golberg;M. Mitome;K. Kurashima;C. Y. Zhi;C. C. Tang;Y. Bando;O. Lourie .In situ electrical probing and bias-mediated manipulation of dielectric nanotubes in a high-resolution transmission electron microscope[J].Applied physics letters,2006(12):123101.1-123101.3.
[13]	Dong LX;Tao XY;Zhang L;Zhang XB;Nelson BJ .Nanorobotic spot welding: Controlled metal deposition with attogram precision from copper-filled carbon nanotubes[J].Nano letters,2007(26):58-63.
[14]	Nakabayashi, D;Silva, PC;Ugarte, D .Inexpensive two-tip nanomanipulator for a SEM[J].Applied Surface Science,2007(1):405-411.
[15]	R. Kaegi;L. Holzer .Transfer of a single particle for combined ESEM and TEM analyses[J].Atmospheric environment,2003(31):4353-4359.
[16]	L. -M. Peng;Q. Chen;X. L. Liang;S. Gao;J. Y. Wang;S. Kleindiek;S. W. Tai .Performing probe experiments in the SEM[J].Micron: The international research and review journal for microscopy,2004(6):495-502.
[17]	Seong Chu Lim;Keun Soo Kim;Im Bok Lee;Seung Yol Jeong;Shinje Cho;Jae-Eun Yoo;Young Hee Lee .Nanomanipulator-assisted fabrication and characterization of carbon nanotubes inside scanning electron microscope[J].Micron: The international research and review journal for microscopy,2005(5):471-476.
[18]	Hoon-Sik Jang;Sung-Hwan Kwon;Amkee Kim;Seung-Hoon Nahm .Tensile test of Individual Multi Walled Carbon Nanotube using Nano-Manipulator inside Scanning Electron Microscope[J].Key engineering materials,2006(1):329-332.
[19]	Qing Chen;Sheng Wang;Lian-Mao Peng .Establishing Ohmic contacts for in situ current-voltage characteristic measurements on a carbon nanotube inside the scanning electron microscope[J].Nanotechnology,2006(4):1087-1098.
[20]	A. B. H. Tay;J. T. L. Thong .High-resolution nanowire atomic force microscope probe grown by a field-emission induced process[J].Applied physics letters,2004(25):5207-5209.
[21]	Utkarsha Singh;Vikas Prakash;Alexis R. Abramson;Wei Chen;Liangti Qu;Liming Dai .Mechanical characterization device for in situ measurement of nanomechanical properties of micro/nanostructures[J].Applied physics letters,2006(7):073103-1-073103-3-0.
[22]	Lee AK;Manns ID;Sakmann B;Brecht M .Whole-cell recordings in freely moving rats.[J].Neuron,2006(4):399-407.

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材料期刊网

扫描电子显微镜下单壁碳纳米管的原位操控与性能

In situ Study on Properties of Single-Walled Carbon Nanotubes by the Nano-Manipulator in a Scanning Electron Microscope

参考文献