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对倒装焊电子封装可靠性进行热循环实验和有限元模拟,结果表明,有底充胶(underfill)时,SnPb焊点的热循环寿命可提高约16倍,并确定了Coffin-Manson半经验方程的参数.采用3种底充胶材料模型,亦即定常弹性模型、温度相关弹性模型和粘弹性材料模型,描述了底充胶U8347-3的力学性能.模拟结果表明,材料模型影响计算得到的SnPb焊点的塑性应变范围、封装形变以及底充胶/芯片界面应力,采用弹性材料模型可能过高估计了SnPb焊点的热循环寿命和界面应力.

参考文献

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