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采用电镀法在Fe基体上电沉积Cu膜.用悬臂梁法在线测量了沉积过程中的Cu膜内的平均应力,进而研究了Cu膜内的应力分布及应力来源.结果表明,Cu膜内的平均应力和分布应力均为拉应力,它们均随膜厚的增加而减小.Cu膜内的界面应力很大,而生长应力很小.再者,基于改进的Thomas-Feimi-Dirac(TFDC)电子理论,对Fe基体上Cu膜内由界面应力引起的平均应力做出了初步估算.结果表明,理论估算结果与实验结果的应力性质完全相同,其值也较接近.这说明理论计算模型具有一定的准确性.

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