采用近空间升华法(close-spaced sublimation,CSS),以CdZnTe化合物粉料为原料制备了CdZnTe薄膜,采用XRD、SEM、紫外光谱仪等对其进行了性能表征,并研究了不同生长温度对薄膜生长速率、结构、Zn含量和光学特性的影响规律.研究结果表明,薄膜的生长速率随着生长温度的升高而增大,且温度>528℃时生长速率迅速增大;不同温度下制备的CdZnTe薄膜结构均为立方相,且都表现出沿(111)晶面的择优生长,高温时择优取向更强一些;晶粒尺寸随着温度升高而增大,在438℃时颗粒尺寸约为1μm,而568℃时约为20tμm;薄膜禁带宽度受温度影响不大,在1.49~1.51eV之间.
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