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薄膜材料的热导率一般与其相应的块体材料有较大的差异.由于其厚度较小,对块体材料热导率的测试方法一般不适用于薄膜材料,因此近几十年来,研究工作者们发明了很多新的用于薄膜热导率的测试方法.综述了薄膜热导率的一些常用测试方法,着重介绍了薄膜热导率的最新测试方法的特点及其适用范围,并针对广泛使用的3ω法进行了详细介绍.

The thermal conductivity of thin solid films is different from their bulk material s. Because of their very small size in thickness, the measurement methods for bulk materials are not suitable for thin film materials. Many new methods have been developed to measure the thermal conductivity of the thin films in recent decades. In this paper, the measurement methods for thin film thermal conductivity are reviewed, the characteristics and application area of the latest measurement are presented,and the 3-omega method, which is widely used in the measurement of the thin solid films, is introduced in detail.

参考文献

[1] Goodson K E;Flik M I .Solid layer thermal-conductivity measurement techniques[J].Applied Mechanics Reviews,1994,47:101.
[2] Cahill D J .Heat transport in dielectric thin films and at solid-solid interfaces[J].Microscale Thermophysical Engineering,1997,1:85.
[3] Graebner J E;Mucha J A;Seibles L .The thermal conductivity of chemical-vapor-deposited diamond films on silicon[J].Journal of Applied Physics,1992,71:3143.
[4] Tai Y C;Mastrangelo et al.Thermal conductivity of heavily doped low-pressure chemical vapor deposited polycrystal-line silicon films Muller[J].Journal of Applied Physics,1988,63:1442.
[5] Visser E P;Versteegen E H;Enckevort J P .Measurement of thermal diffusion in thin films using a modulated laser technique:Application to chemical-vaporvdeposited diamond films Enckevort[J].Journal of Applied Physics,1992,71:3238.
[6] Graebner J E;Jin S;Kammlott G W .Anisotropic thermal conductivity in chemical vapor deposition diamond[J].Journal of Applied Physics,1992,71:5353.
[7] Parker W J;Butler C P .Flash method of determining thermal diffusivity,heat capacity,and thermal conductivity[J].Journal of Applied Physics,1961,32:1679.
[8] Oleg Yu. Troitsky;Harald Reiss .A Numerical Simulation to Propose a Flash Method for In Situ Detection of the Thermal Diffusivity of Anisotropic Thin Film Materials[J].International Journal of Thermophysics,2009(4):1283-1299.
[9] 葛山,尹玉成.激光闪光法测定耐火材料导热系数的原理与方法[J].理化检验-物理分册,2008(02):75-78,96.
[10] 孙建平,刘建庆,邱萍,李晓苇.激光闪光法测量材料热扩散率的漏热修正[J].计量技术,2008(01):23-25.
[11] 陈跃飞,张金涛,于帆,刘建庆,关维绮.激光闪光法测量材料热扩散率国际比对的实验研究与分析[J].计量技术,2008(12):29-32.
[12] Hatta I;Kato R .Thermal diffusivity measurement of thin films by means of an ac calorimetric method[J].Review of Scientific Instruments,1985,56:1643.
[13] 许自强,唐祯安,黄正兴,丁海涛.基于交流量热法的薄膜热扩散率自动测试系统的研究[J].仪器仪表学报,2005(08):797-800,821.
[14] Okuda M .A novel method for measuring the thermal conductivity of submicrometre thick dielectric films[J].Thin Solid Films,1992,213:176.
[15] 唐祯安,黄正兴,顾毓沁,朱德忠.MEMS中薄膜热物性测试方法研究[J].仪表技术与传感器,2003(02):6-11,14.
[16] 谢华清,王锦昌,奚同庚,刘岩.薄膜材料导热行为及其测试和预测[J].材料科学与工艺,2001(01):104-112.
[17] Kading O W et al.Thermal conduction in metallized silicondioxide layers on silicon[J].Applied Physics Letters,1994,65(13):1629.
[18] BAI Su-Yuan,TANG Zhen-An,HUANG Zheng-Xing,YU Jun,WANG Jia-Qi.Thermal Conductivity Measurement of Submicron-Thick Aluminium Oxide Thin Films by a Transient Thermo-Reflectance Technique[J].中国物理快报(英文版),2008(02):593-596.
[19] Chien Heng-Chieh et al.Thermal conductivity measurement and interface thermal resistance estimation using SiO_2 thin film[J].Review of Scientific Instruments,2008,79:054902.
[20] Chu Dachen et al.Thermal conductivity measurements of thin-film resistst[J].Journal of Vacuum Science and Technology B:Microelectronics and Nanometer Structures,2001,19(06):2874.
[21] W.F. Bu;D.W. Tang;Z.L. Wang;X.H. Zheng;G.H. Cheng;Tang;Z;L;Wang;X;H;Zheng;G;H;Cheng .Modulated Photothermal Reflectance Technique For Measuring Thermal Conductivity Of Nano Film On Substrate And Thermal Boundary Resistance[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2008(23):8359-8362.
[22] Cahill D G .Thermal conductivity measurement from 30 to 750K:The 3ω method[J].Review of Scientific Instruments,1990,61(02):802.
[23] Kim J;Feldman A et al.Application of the three omega thermal conductivity measurement method to a film on a substrate of finite thickness[J].Review of Scientific Instruments,1999,86(07):3959.
[24] Lee SM.;Cahill DG. .HEAT TRANSPORT IN THIN DIELECTRIC FILMS[J].Journal of Applied Physics,1997(6):2590-2595.
[25] Liu W L;Borca-Tasciuc T et al.Anisotropic thermal conductivity of Ge quantum-dot and symmetrically strained Si/ Ge superlattices[J].Journal of Nanoscience and Nanotechnology,2001,1:39.
[26] Borca-Tasciuc T.;Chen G.;Kumar AR. .Data reduction in 3 omega method for thin-film thermal conductivity determination[J].Review of Scientific Instruments,2001(4):2139-2147.
[27] Extending the 3ω method for thin-film analysis to high frequencies[J].Journal of Applied Physics,2003(10):6050-6055.
[28] Ankur Jain;Kenneth E. Goodson .Measurement of the Thermal Conductivity and Heat Capacity of Freestanding Shape Memory Thin Films Using the 3ω Method[J].Journal of heat transfer: Transactions of the ASME,2008(10):102402-1-102402-7-0.
[29] Gurrum S P;King W P;Joshi Y K .A semianalytical solution for the 3 method including the effect of heater thermal conduction[J].Journal of Applied Physics,2008,103:113517.
[30] Alvarez-Quintana J.Extension of the 3ω method to measure the thermal conductivity of thin films without a reference sample[J].Sensors and Actuators A:Physical,2008:142-232.
[31] Wang ZL;Tang DW;Zheng XH .Simultaneous determination of thermal conductivities of thin film and substrate by extending 3 omega-method to wide-frequency range[J].Applied Surface Science: A Journal Devoted to the Properties of Interfaces in Relation to the Synthesis and Behaviour of Materials,2007(22):9024-9029.
[32] Choi T Y;Poulikakosa D .Measurement of thermal conductivity of individual multiwalled carbon nanotubes by the method[J].Applied Physics Letters,2005,87:013108.
[33] Choi TY;Poulikakos D;Tharian J;Sennhauser U .Measurement of the thermal conductivity of individual carbon nanotubes by the four-point three-omega method[J].Nano letters,2006(8):1589-1593.
[34] Ahmed S;Liske R et al.Extending the 3ω-method to the MHz range for thermal conductivity measurements of diamond thin films[J].Diamond and Related Materials,2006,15:389.
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