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采用光刻剥离工艺和射频磁控溅射法分别在(100)硅片和ITO玻璃衬底上制备了以氧化锌为沟道层的底栅式薄膜晶体管(ZnO-TFT).用X射线衍射仪、原子力显微镜对生长在绝缘层上的ZnO薄膜进行了表征.在硅衬底ZnO-TFT中,热氧化生长的二氧化硅薄膜作为绝缘层,金属铝用作源漏电极,该器件工作在N沟道增强模式,其阈值电压为8V,电流开关比为5×103,电子的场迁移率达到0.61cm2/(V·s).在以ITO玻璃为衬底的透明ZnO-TFT中,分别采用了SiO2、Al2O3、SiNx、PbTiO3薄膜作为绝缘层,实验表明生长在不同绝缘层上的ZnO薄膜都有很高的c轴择优取向,透明ZnO-TFT在可见光波段的平均透过率达到85%.

参考文献

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