采用射频磁控溅射技术先在硅衬底上制备Ga2O3/ Nb薄膜,然后在900℃时于流动的氨气中进行氨化制备GaN纳米线.用X射线衍射(XRD)、傅立叶红外吸收光谱(FTIR)、扫描电子显微镜(SEM)、透射电子显微镜(TEM)详细分析了GaN纳米线的结构和形貌.结果表明:采用此方法得到的GaN纳米线为六方纤锌矿结构,其纳米线的直径大约在50～100nm之间,纳米线的长约几个微米.室温下以325nm波长的光激发样品表面,只显示出一个位于364.4nm的很强的紫外发光峰.最后,简单讨论了GaN纳米线的生长机制.
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