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透射电子显微镜(Transimission Electron Microscope,TEM)薄膜样品的制备质量在TEM观察中非常重要.总结了钢铁材料TEM样品制备过程中的一些经验,对于采用双喷电解抛光方法制备的效果不理想的钢铁TEM样品,采用电解双喷减薄和离子减薄联合可以成功制备地TEM薄膜样品.

参考文献

[1] Young Min Park;Dong-Su Ko;Kyung-Woo Yi .Measurement and estimation of temperature rise in TEM sample during ion milling[J].Ultramicroscopy,2007(8):663-668.
[2] 屠世润;高越.金相原理与实践[M].北京:机械工业出版社,1990
[3] Chen Houwen;Wang Rong .Bulk-Compositional Changes of Ni2Al3 and NiAl3 During Ion Etching[J].Nuclear Intruments and Methods in Physics Research B,2008,266:1062.
[4] Edward A Kenik .Loss of Grain Boundary Segregant During Ion Milling[J].Journal of Eelectron Microscopy Technique,1991,18(02):167.
[5] Barna A;Pécz B;Menyhard M .Amorphisation and Surface Morphology Development at Low-Energy Ion Milling[J].Ultramicroscopy,1998,70(03):161.
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