采用固相反应工艺制备了Sm3+掺杂层状结构无铅Bi4-xSmxTi3O12(x=0.00,0.25,0.50,0.75,1.00,1.25)介电陶瓷.利用XRD、SEM等测试方法研究了Sm掺杂量、烧结温度和保温时间对Bi4-xSmxTi3O12 (BST) 陶瓷晶体结构及电性能的影响.结果表明:所制备的Bi4-xSmxTi3O12陶瓷均具有单一正交相结构,BST陶瓷表面晶粒的显微形貌表现为随机排列的棒状结构.样品的铁电性能测试表明,Sm3+施主掺杂明显降低了BIT的电导率,随着Sm3+含量的增加,Sm3+逐渐有部分取代B位,由于Sm3+取代Ti4+大大降低了氧空位的浓度,使得氧空位对电畴的钉扎作用减弱,并且材料的剩余极化Pr也相应提高.
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