在常压下用烧结法制备了具有高有序晶列结构的Bi4Si3O12微晶.利用X射线衍射(X-ray diffraction,XRD)和环境扫描电镜(Environmental Scanning Electron Microscopy,ESEM)分析了生成晶体的物相和微观形貌.结果表明:生成的是纯的立方相Bi4Si3O12晶体.Bi4Si3O12晶粒总是成对分布,且排列成行,从而形成高有序的晶列结构.其晶粒尺寸变化趋势有两种,一种是逐渐增大或者减小,另一种是晶粒尺寸在某一区域值内基本保持不变.在大多数情况下,每个晶行两侧的晶粒变化趋势具有一致性,每行两侧的晶粒尺寸具有高度的正相关特性.如果某行两侧的晶粒尺寸变化趋势不一致,而且晶粒尺寸不相关,则该行两侧晶粒应该属于两种不同的变化趋势.
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